MT2Way Interaction Algorithm for Pairwise Test Data Generation

To reduce the number of test cases by utilized the minimum possible amount of time throughout the testing process of software and hardware is highly desirable. For ensuring the stability of the technique the combination of a complete set of available inputs is recommended to be executed. But generally an exhaustive numbers of test cases are hard to execute. Therefore, test data generation is an NP-hard (non-deterministic polynomial-time hard) problem. This is likely to present significant issues in difficulties interpreting the best possible method for generating the test data. The reduction of test cases usually depends on the interaction level. 2-way interaction or pair wise test data can reduce high number of test cases. This efficiently addresses most of the software errors. In this paper has been addressed an effective 2-way interaction algorithm to generate the test data which is more acceptable in terms of the number of test cases.